1.
Life on Hold Finding Hope in the Face of Serious Illness
by Seiler, David G., Brunvoll,...
ISBN: 9781590528273
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2.
Metrology and Diagnostic Techniques for Nanoelectronics
by Ma, Zhiyong, Seiler, David G.
ISBN: 9789814745086
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Life on Hold Finding Hope in the Face of Serious Illness
by Brunvoll, Laurel Seiler, Se...
ISBN: 9781576737606
List Price: $10.99
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Frontiers of Characterization and Metrology for Nanoelectronics
by Seiler, David G., Diebold, ...
ISBN: 9780735404410
5.
Characterization and Metrology for Ulsi Technology 2003 International Conference on Characte...
by Seiler, David G., Diebold, ...
ISBN: 9780735401525
List Price: $210.00
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Frontiers of Characterization and Metrology for Nanoelectronics: 2009 (AIP Conference Procee...
by Secula, Erik M., Seiler, Da...
ISBN: 9780735407121
List Price: $219.00
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Characterization and Metrology for Ulsi Technology 2000 International Conference
by Seiler, David G., Diebold, ...
ISBN: 9781563969676
List Price: $185.00
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Characterization and Metrology for ULSI Technology : Proceedings of the 1998 AIP Internation...
by Seiler, David G.
ISBN: 9781563968686
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Hgcdte Detector Reliability Study for the Goes Program (Classic Reprint)
by Seiler, David G.
ISBN: 9781528509114
List Price: $9.57
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Hgcdte Detector Reliability Study for the Goes Program (Classic Reprint)
by Seiler, David G.
ISBN: 9780266934196
List Price: $26.27